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Probe Station
Fully automatic wafer probe station

Suitable for 4-12 inch wafer testing, it can provide different testing environment configurations such as high and low temperature, high voltage, and low leakage
The device is simple to use, with stable performance, high efficiency, low vibration, and low noise

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Fully automatic wafer probe station


8英寸半自動(dòng)探針臺(tái)



    The highest accuracy can reach ± 1 micrometer, using a fully closed-loop operation control system to achieve high-precision, high-efficiency, and robust positioning motion
The minimum IndexTime can reach 240 milliseconds, with a large base and high rigidity structure, achieving high load, low vibration, and fast tuning motion
The maximum lifting force is 750kgf, and the Z-axis four bar integrated support achieves the minimum deformation under high load or unbalanced load conditions
Testing temperature range -40 ° C to 200 ° C, independently developing various CHUCKs to solve core process problems and achieve precise temperature control



FUNCTION

Wafer Alignment Function
Wafer ID OCR function
Compatible with up to 2 million dies
Adjustment and retesting, compatible with mainstream foreign models in both directions
Quickly generate a map from guided files
Repeat Touch function
Needle Alignment Function
PMI needle mark detection function
GPIB communication
Holding SECS/GEM communication protocol
Offline editing of Map and Die attributes
Fully compatible with the Map file format of mainstream foreign models






規(guī)格參數(shù):






C300 H300 T300 M300
適用場(chǎng)合 通用機(jī)型 通用機(jī)型 適用于三溫 適用于存儲(chǔ)
適用晶圓尺寸 12寸/8寸
適用晶圓厚度* 200~2200μm 200~2200μm 200~2200μm 200~2200μm
綜合精度 XY軸:±1μm
ZF軸:±2μm
XY軸:±1μm
ZF軸:±2μm
XY軸:±1μm
ZF軸:±2μm
XY軸:±1μm
ZF軸:±2μm
Index time 240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
240ms
(X/Y:10mm,Z:0.5mm)
針測(cè)壓力 250kgf 250kgf 250kgf 750kgf
測(cè)試溫度* 常溫 常溫~150℃ -55~200℃ 常溫~150℃
測(cè)試機(jī)對(duì)接方式* Cable,Hard Docking,Direct
Docking
Cable,Hard Docking,Direct
Docking
Cable,Hard Docking,Direct
Docking
Hinge,Auto-leveling
通訊接口 GPIB,RS232 GPIB,RS232 GPIB,RS232 GPIB,RS232
設(shè)備尺寸 1680mm(W)*1890mm(D)*14
90mm(H)
1680mm(W)*1890mm(D)*14
90mm(H)
1680mm(W)*2080mm(D)*14
90mm(H)
2000mm(W)*1890mm(D)*14
90mm(H)
設(shè)備重量 2000kg 2000kg 2000kg 2200kg
電力要求 220VAC1.0KVA 220VAC 2.0KVA 220VAC5.7KVA 220VAC 2.0KVA
壓縮空氣氣壓 ≥0.6MPa ≥0.6MPa ≥0.6MPa ≥0.6MPa
真空氣壓 ≤-60kPa ≤-60kPa ≤-60kPa ≤-60kPa





※支持伯努利手指,滿足薄片要求      ※支持溫度定制-60℃      ※支持自動(dòng)換卡 (APC) ※支持加裝FFU, 滿足高潔凈度要求
C200 H200 T200 T200HV
適用場(chǎng)合 通用機(jī)型 通用機(jī)型 適用于三溫 適用于三代半
適用晶圓尺寸 8寸/6寸/5寸/4寸
適用晶圓厚度* 200~2200μm 200~2200μm 200~2200μm 200~2200μm
綜合精度 XY軸:±2μm
ZF軸:±2μm
XY軸:±2μm
ZF軸:±2μm
XY軸:±2μm
ZF軸:±2μm
XY軸:±2μm
ZF軸:±2μm
Index time
250ms
(X/Y:10mm,Z:0.5mm)

250ms
(X/Y:10mm,Z:0.5mm)
250ms
(X/Y:10mm,Z:0.5mm)

250ms
(X/Y:10mm,Z:0.5mm)
針測(cè)壓力 150kgf 150kgf 150kgf 150kgf
測(cè)試溫度* 常溫 常溫~150℃ -55~150℃ -40~150℃
測(cè)試機(jī)對(duì)接方式 Cable,Hard Docking Cable,Hard Docking Cable,Hard Docking Cable,Hard Docking
通訊接口 GPIB,RS232 GPIB,RS232 GPIB,RS232 GPIB,RS232
設(shè)備尺寸 1300mm(W)*1542mm(D)*96
0mm(H)

1300mm(W)*1542mm(D)*96
0mm(H)
1300mm(W)*1740mm(D)*96
0mm(H)
1300mm(W)*1740mm(D)*96
0mm(H)
設(shè)備重量 1200kg 1200kg 1200kg 1200kg
電力要求 220VAC1.0KVA 220VAC 2.0KVA 220VAC5.7KVA 220VAC5.7KVA
壓縮空氣氣壓 ≥0.6Mpa ≥0.6Mpa ≥0.6Mpa ≥0.6Mpa
真空氣壓 ≤-60kPa ≤-60kPa ≤-60kPa ≤-60kPa
※支持伯努利手指,滿足薄片要求 ※支持溫度定制-60℃ ※支持加裝FFU, 滿足高潔凈度要求








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